Pseudo-gray-scale halftone gratings for shearing and Hartmann wavefront sensors

Now in use on x-ray beamlines worldwide, shearing interferometry and Hartmann wavefront sensing provide effective feedback for measuring optimizing high-quality beams. Conventionally, both approaches spatially modulate the beam properties (amplitude or phase) using two-tone, binary patterns, leading to deleterious diffraction effects that must be mitigated. In shearing, presence of multiple orders affects measurement near boundaries. Hartmann, limits point density. We demonstrate pseudo-gray-scale halftone patterns diffracting elements can improve performance techniques.